UVISEL-2 spectroscopic ellipsometer by HORIBA Jobin Yvon for determining thickness and optical properties of thin films.
- Spectral range 190 – 2000 nm
- Angular position from 40 to 90 degrees
- Stage movement range: 0÷ 200 mm in X axis and 0 ÷ 200 mm in Y axis
- Modelling software containing a large base of materials allows fitting the model to measurement conditions and material properties
- Thickness and optical properties measurements for thin films made of transparent or partially transparent materials
- Thickness and optical properties measurements for multi-layer materials